IIB 2024
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  • Home
    • Previous editions
  • Committees
  • Program
    • Detailed schedule
    • Plenary speakers
    • Call for papers
    • Instructions to authors
    • Submission and registration form
    • Publication
  • Sponsors
  • Information
    • Deadlines & fees
    • Your venue
    • Profile page
  • Contacts
dahmen_uli

Uli Dahmen

LBNL, Berkeley, USA

Title of the invited presentation:

“Atomic-Scale Observations of Step Structure and Migration Mechanisms in Interfaces”

Bio:

Ulrich Dahmen obtained his Ph.D. in Materials Science from UC Berkeley in 1979, then joined Berkeley Lab in a postdoctoral position, and subsequently was named principal investigator and senior staff scientist. From 1992 to 2014 he directed the National Center for Electron Microscopy at Berkeley Lab, where he continues to serve as senior advisor.

From 2004-2009, he led the TEAM Project, a large collaborative effort within the US Department of Energy, which helped advance the development of electron microscopy. As principal investigator he led a research program on the Crystallography of Microstructures, using electron microscopy as a major tool for microstructural characterization. His research focuses on the relationship between atomic structure and behavior of materials.

He has published extensively on the crystallographic structure of interfaces, the evolution of precipitate morphologies and the effects of size and shape on the behavior of embedded nanoparticles.

Other Speakers

ikuhara_yuichiYuichi Ikuhara
li_chenChen Li
mishin_yuriYuri Mishin
david_srolovitzDavid Srolovitz
divinski_sergiySergiy Divinski
si_young_choiSi-Young Choi
frederic_mompiouFrédéric Mompiou
Contact

For any request, please contact:

+33 (0)2 47 27 33 30

secretary@iib2024.org
Important Dates

Extended deadline for submission abstract:
February 29th, 2024

Notification of acceptance:
March 15th, 2024

Early bird fee deadline:
May 15th, 2024

 

Organizers

Tsinghua University;
Beijing University of Technology;
Taiyuan University of Technology.

Supporting Organizations

Committee on Defects in Solids, Chinese Physics Society;
Committee on Electron Microscopy and Committee on Ceramics, Chinese Crystallography Society.

Propulsed by VERT COM agency